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Electronic Design, Test and Applications, IEEE International Workshop on (2010)
Ho Chi Minh City, Vietnam
Jan. 13, 2010 to Jan. 15, 2010
ISBN: 978-0-7695-3978-2
TABLE OF CONTENTS
Papers

[Front cover] (PDF)

pp. C1

Title Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Run (Abstract)

pp. 245-249

Author Index (PDF)

pp. 367-369

[Roster] (PDF)

pp. 370
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