The Community for Technology Leaders
Electronic Design, Test and Applications, IEEE International Workshop on (2008)
Jan. 23, 2008 to Jan. 25, 2008
ISBN: 978-0-7695-3110-6
TABLE OF CONTENTS
Papers

list-reviewer (PDF)

pp. xxi

Title Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Organizing Committee (PDF)

pp. xviii-xx

Author Index (PDF)

pp. 607-610
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