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Electronic Design, Test and Applications, IEEE International Workshop on (2002)
Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 443
Y. S. Lee , The Hong Kong Polytechnic University
Mike W.T. Wong , The Hong Kong Polytechnic University
ABSTRACT
Analysis of equivalent single parametric component faults in a Resistance-Temperature-Detector (RTD) sensor circuit under steady-state d.c. condition is used to systematically adjust component parameters for enhanced fault diagnosis. Component tolerances are accounted for when evaluating the effectiveness of the proposed changes.
INDEX TERMS
Analog testing, fault diagnosis, equivalent faults
CITATION
Matthew Worsman, Y. S. Lee, Mike W.T. Wong, "Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis", Electronic Design, Test and Applications, IEEE International Workshop on, vol. 00, no. , pp. 443, 2002, doi:10.1109/DELTA.2002.994669
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