Electronic Design, Test and Applications, IEEE International Workshop on (2002)

Christchurch, New Zealand

Jan. 29, 2002 to Jan. 31, 2002

ISBN: 0-7695-1453-7

pp: 413

Seiji Kajihara , Kyushu Institute of Technology

Kenjiro Taniguchi , Kyushu Institute of Technology

Irith Pomeranz , Purdue University

Sudhakar M. Reddy , University of Iowa

ABSTRACT

This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified values of test vectors to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce test data volume to less than 40% of the original test sets.

INDEX TERMS

Test Data Compression, Statistical Encoding, Don't Care Identification, Huffman's algorithm

CITATION

Seiji Kajihara,
Kenjiro Taniguchi,
Irith Pomeranz,
Sudhakar M. Reddy,
"Test Data Compression Using Don't-Care Identification and Statistical Encoding",

*Electronic Design, Test and Applications, IEEE International Workshop on*, vol. 00, no. , pp. 413, 2002, doi:10.1109/DELTA.2002.994661SEARCH