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Electronic Design, Test and Applications, IEEE International Workshop on (2002)
Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 408
Gabriela Peretti , National University of Technology, Regional School at Villa Mar?
Eduardo Romero , National University of Technology, Regional School at Villa Mar?
Franco Salvático , National University of Technology, Regional School at Villa Mar?
Carlos Marqués , National University of C?rdoba
ABSTRACT
This work presents an off-line Built -In Self-Test for timing systems based on synchronous BCD counters. We adopt for this case study a functional approach, exploiting the functional characteristics of the modules in the system for test pattern generation. Different alternatives for test sequences, simulation and experimental results are shown. Fault coverage of 95% and 100% are obtained under different test sequences. The test time scales up linearly with the number of cascaded counters, and the hardware overhead becomes less significant as the number of counters increases.
INDEX TERMS
digital testing, off-line built-in self-test, functional test, synchronous systems
CITATION

E. Romero, C. Marqués, F. Salvático and G. Peretti, "A Functional Approach to Test Cascaded BCD Counters," Electronic Design, Test and Applications, IEEE International Workshop on(DELTA), Christchurch, New Zealand, 2002, pp. 408.
doi:10.1109/DELTA.2002.994660
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