Electronic Design, Test and Applications, IEEE International Workshop on (2002)
Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
Kohei Miyase , Kyushu Institute of Technology
Seiji Kajihara , Kyushu Institute of Technology
Sudhakar M. Reddy , University of Iowa
In this paper, we propose a procedure to compact a test set for a combinational circuit. Given a test set in which all input values are specified, the procedure first identifies don't care inputs of the test set, and next reassigns appropriate values to the don't cares to achieve test compaction. The procedure can be applied repeatedly, until further compaction cannot be derived. Experimental results show effectiveness of the proposed procedure for the ISCAS benchmark circuits.
Static Test Compaction, Coloring Problem, Don't Care Identification, ATPG
K. Miyase, S. M. Reddy and S. Kajihara, "A Method of Static Test Compaction Based on Don't Care Identification," Electronic Design, Test and Applications, IEEE International Workshop on(DELTA), Christchurch, New Zealand, 2002, pp. 392.