Electronic Design, Test and Applications, IEEE International Workshop on (2002)

Christchurch, New Zealand

Jan. 29, 2002 to Jan. 31, 2002

ISBN: 0-7695-1453-7

pp: 355

Nasser Masoumi , University of Waterloo

Mohamed I. Elmasry , University of Waterloo

Safieddin Safavi-Naeini , University of Waterloo

Haydar Hadi , University of Waterloo

ABSTRACT

Accurate and fast evaluation of substrate coupled noise has become a key-factor in today's mixed-signal RF IC design. In this work, we present efficient and closed-form analytical solutions for modeling substrate coupling in VLSI circuits. Using Maxwell's equations and the Green's theorem an integral equation for the extraction of substrate parasitic elements is developed. We utilize a fast-convergent Green's function in the integral equation. We also derive analytical solutions for the fourfold integrals of the Green's function. Finally, the impact of using the proposed models on the speed up of the computations required for the extraction process is demonstrated.

INDEX TERMS

Substrate coupling modeling, Green's function, image method

CITATION

S. Safavi-Naeini, N. Masoumi, M. I. Elmasry and H. Hadi, "A Novel Analytical Model for Evaluation of Substrate Crosstalk in VLSI Circuits,"

*Electronic Design, Test and Applications, IEEE International Workshop on(DELTA)*, Christchurch, New Zealand, 2002, pp. 355.

doi:10.1109/DELTA.2002.994649

CITATIONS

SEARCH