Electronic Design, Test and Applications, IEEE International Workshop on (2002)

Christchurch, New Zealand

Jan. 29, 2002 to Jan. 31, 2002

ISBN: 0-7695-1453-7

pp: 272

H. Hauser , Vienna University of Technology

P. Fulmek , Vienna University of Technology

F. Himmelstoss , Vienna University of Technology

T. Wolbank , Vienna University of Technology

R. Wöhrnschimmel , Vienna University of Technology

P. Wurm , Vienna University of Technology

ABSTRACT

The nonlinear dependence on history of magnetic field and magnetization in ferromagnetic materials is described by statistical domain behaviour using phenomenological parameters. These parameters are related to macroscopic hysteresis features (as coercivity, initial susceptibility, saturation, and remanence), which allows fast and easy identification. Examples of model applications are the prediction of the magnetic behaviour of transformersin dc/dc-converters, inverter-fed electrical machines, and magnetoresistive sensors.

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CITATION

H. Hauser, P. Fulmek, R. Wöhrnschimmel, P. Wurm, T. Wolbank and F. Himmelstoss, "Magnetic Hysteresis Modeling of Electronic Components,"

*Electronic Design, Test and Applications, IEEE International Workshop on(DELTA)*, Christchurch, New Zealand, 2002, pp. 272.

doi:10.1109/DELTA.2002.994628

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