Electronic Design, Test and Applications, IEEE International Workshop on (2002)
Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
Meng-Lieh Sheu , National Chi-Nan University
Tai-Ping Sun , National Chi-Nan University
Far-Wen Jih , National Chi-Nan University
A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated.
Test Socket Chip, Infrared(IR), Focal Plane Array(FPA), Dark Current
F. Jih, M. Sheu and T. Sun, "Test Socket Chip for Measuring Dark Current in IR FPA," Electronic Design, Test and Applications, IEEE International Workshop on(DELTA), Christchurch, New Zealand, 2002, pp. 167.