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Electronic Design, Test and Applications, IEEE International Workshop on (2002)
Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 167
Far-Wen Jih , National Chi-Nan University
Meng-Lieh Sheu , National Chi-Nan University
Tai-Ping Sun , National Chi-Nan University
ABSTRACT
A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated.
INDEX TERMS
Test Socket Chip, Infrared(IR), Focal Plane Array(FPA), Dark Current
CITATION
Far-Wen Jih, Meng-Lieh Sheu, Tai-Ping Sun, "Test Socket Chip for Measuring Dark Current in IR FPA", Electronic Design, Test and Applications, IEEE International Workshop on, vol. 00, no. , pp. 167, 2002, doi:10.1109/DELTA.2002.994608
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