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Electronic Design, Test and Applications, IEEE International Workshop on (2002)
Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 13
Zhen Guo , New Jersey Institute Of Technology
Jacob Savir , New Jersey Institute Of Technology
ABSTRACT
Observer-based test methodology is proposed in this paper for detecting parametric faults in analog linear time-invariant circuits. A Kalman filter is used to reduce the measurement noise. Experiments conducted on an analog circuit are used to test the viability of the test methodology. The paper also discusses some inherent limitations of analog test in general. We show that, in the analog test domain, a fault-free parameter may mask the detection of a faulty parameter. Moreover, one faulty parameter may mask the detection of another faulty parameter leaving them both undetected.
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CITATION

J. Savir and Z. Guo, "Observer-Based Test of Analog Linear Time-Invariant Circuits," Electronic Design, Test and Applications, IEEE International Workshop on(DELTA), Christchurch, New Zealand, 2002, pp. 13.
doi:10.1109/DELTA.2002.994581
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