The Community for Technology Leaders
Electronic Design, Test and Applications, IEEE International Workshop on (2002)
Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 8
Arun A. Joseph , MESA+ Research Institute
Hans G. Kerkhoff , MESA+ Research Institute
Sander Heuvelmans , MESA+ Research Institute
ABSTRACT
True software-defined radio cellular base stations require extremely fast data converters, which can currently not be implemented in semiconductor technology. Superconductor Niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as still very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and it is illustrated how BIST can be a solution of detecting these defects in ADCs under extreme conditions.
INDEX TERMS
CITATION
Arun A. Joseph, Hans G. Kerkhoff, Sander Heuvelmans, "Testable Design and Testing of High-Speed Superconductor Microelectronics", Electronic Design, Test and Applications, IEEE International Workshop on, vol. 00, no. , pp. 8, 2002, doi:10.1109/DELTA.2002.994580
99 ms
(Ver )