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Defect Based Testing, IEEE International Workshop on (2005)
Palm Springs, CA, USA
May 1, 2005 to May 1, 2005
ISBN: 1-4244-0034-1
TABLE OF CONTENTS
Papers

Sensitivity analysis of quiescent signal analysis for defect detection (Abstract)

D. Acharyya , Dept. of Comput. Sci.&Electr. Eng., Maryland Univ., Baltimore, MD, USA
A. Singh , Dept. of Comput. Sci.&Electr. Eng., Maryland Univ., Baltimore, MD, USA
M. Tehranipoor , Dept. of Comput. Sci.&Electr. Eng., Maryland Univ., Baltimore, MD, USA
C. Patel , Dept. of Comput. Sci.&Electr. Eng., Maryland Univ., Baltimore, MD, USA
J. Plusquellic , Dept. of Comput. Sci.&Electr. Eng., Maryland Univ., Baltimore, MD, USA
pp. 3-10

Electrical analysis of a domino logic cell with GOS faults (Abstract)

M. Renovell , Graduate Sch. of Inf. Sci., Nara Inst. of Sci.&Technol., Japan
M. Comte , Graduate Sch. of Inf. Sci., Nara Inst. of Sci.&Technol., Japan
S. Ohtake , Graduate Sch. of Inf. Sci., Nara Inst. of Sci.&Technol., Japan
pp. 34-41

Electrical and topological characterization of interconnect open defects (Abstract)

R. Rodriguez-Montanes , Dept. of Electron. Eng., Univ. Politecnica de Calalunya, Barcelona, Spain
J. Figueras , Dept. of Electron. Eng., Univ. Politecnica de Calalunya, Barcelona, Spain
pp. 42-46
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