The Community for Technology Leaders
Design, Automation & Test in Europe Conference & Exhibition (2008)
Munich, Germany
Mar. 10, 2008 to Mar. 14, 2008
ISBN: 978-3-9810801-3-1
pp: ii
The following topics were dealt with: system specification; system modeling; MPSoC; system design methods; system synthesis; system optimisation; low power systems; formal verification; network on chip; microarchitectural design; architectural synthesis; reconfigurable computing; logic synthesis; technology dependent synthesis; deep-submicron circuits; physical design; analogue and mixed A/D systems; CAD; interconnect modelling; EMC; packaging; signal processing; wireless communication; secure and security systems; space and avionics systems; MEMS; sensor systems; multi-core platforms; mixed signal systems; industrial test; design for test; BIST; test generation; on-line testing; compilers; code generation; embedded systems and automotive electronics.
"Design, Automation and Test in Europe [Title page]", Design, Automation & Test in Europe Conference & Exhibition, vol. 00, no. , pp. ii, 2008, doi:10.1109/DATE.2008.4484626
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