The Community for Technology Leaders
Design, Automation & Test in Europe Conference & Exhibition (2005)
Munich, Germany Germany
Mar. 7, 2005 to Mar. 11, 2005
ISSN: 1530-1591
ISBN: 0-7695-2288-2
TABLE OF CONTENTS
Intro

Technical Program Chairs (PDF)

pp. xvii,xviii

list-reviewer (PDF)

pp. xxiv,xxv,xxvi

Tutorials [10 abstracts] (PDF)

pp. xxx,xxxi,xxxii,xxxiii

A fast concurrent power-thermal model for sub-100 nm digital ICs (Abstract)

J.L. Rossello , Electron. Technol. Group, Univ. de les Illes Baleares, Palma de Mallorca, Spain
V. Canals , Electron. Technol. Group, Univ. de les Illes Baleares, Palma de Mallorca, Spain
S.A. Bota , Electron. Technol. Group, Univ. de les Illes Baleares, Palma de Mallorca, Spain
pp. 206-211 Vol. 1
8B: Interconnect Solutions: Timing, Noise, and Process Variations

Modeling interconnect variability using efficient parametric model order reduction (Abstract)

Peng Li , Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
pp. 958,959,960,961,962,963
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