Design, Automation & Test in Europe Conference & Exhibition (2004)
Feb. 16, 2004 to Feb. 20, 2004
Jennifer Dworak , Texas A&M University
Brad Cobb , Texas A&M University
James Wingfield , Texas A&M University
M. Ray Mercer , Texas A&M University
Dynamic defects are less likely to be fortuitously detected than static defects because they have more stringent detection requirements. We show that (in addition to more site observations) balanced excitation is essential for detection of these defects, and we present a metric for estimating this degree of balance. We also show that excitation balance correlates with the parameter τ in the MPG-D defective part level model.
J. Dworak, M. R. Mercer, B. Cobb and J. Wingfield, "Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects," Design, Automation & Test in Europe Conference & Exhibition(DATE), Paris, France, 2004, pp. 21066.