A New Design Flow and Testability Measure for the Generation of a Structural Test and BIST for Analogue and Mixed-Signal Circuits
Mar. 4, 2002 to Mar. 8, 2002
For the generation of defect-oriented tests a system is de-veloped that includes the synthesis of self-test structures. With the objective to generate a highly efficient analogue test, the fault simulation methods are greatly enhanced: (1) A new testability measure, (2)the possibility to distinguish between not-to-detect and hard-to-detect faults with respect to the tolerances of the respective measurement system. By presenting a new design flow and using the fault simulation in a very early design stage a tool-suite is developed. It allows to control the defect-robust layout and to eliminate those faults that limit the efficiency of a measurement system. This allows for economic self-test applications! It is demonstrated that the system finds the most efficient and less expense test for a given fault set. With the presented results it is possible to include the defect-oriented approach from the fault simulation to the automatic generation of layout rules and the test synthesis in an industrial design flow.
C. Hoffmann, "A New Design Flow and Testability Measure for the Generation of a Structural Test and BIST for Analogue and Mixed-Signal Circuits", DATE, 2002, Design, Automation & Test in Europe Conference & Exhibition, Design, Automation & Test in Europe Conference & Exhibition 2002, pp. 0197, doi:10.1109/DATE.2002.998270