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2013 1st International Workshop on Data Analysis Patterns in Software Engineering (DAPSE) (2013)
San Francisco, CA, USA
May 21, 2013 to May 21, 2013
ISBN: 978-1-4673-6296-2
TABLE OF CONTENTS

[Front cover] (PDF)

pp. i-ii

Contents (PDF)

pp. 1

Foreword (PDF)

Christian Bird , Microsoft Research, USA
Tim Menzies , West Virginia University, USA
Thomas Zimmermann , Microsoft Research, USA
pp. iii-iv

Building Statistical Language Models of code (Abstract)

Peter Schulam , Language Technologies Institute, Carnegie Mellon University, USA
Roni Rosenfeld , Language Technologies Institute, Carnegie Mellon University, USA
Premkumar Devanbu , Dept. of Computer Science, University of California at Davis, USA
pp. 1-3

Commit graphs (Abstract)

Maximilian Steff , Faculty of Computer Science, Free University of Bozen-Bolzano, Italy
pp. 4-5

Concept to commit: A pattern designed to trace code changes from user requests to change implementation by analyzing mailing lists and code repositories (Abstract)

Scott McGrath , College of Information Science and Technology, University of Nebraska at Omaha, United States
Kiran Bastola , College of Information Science and Technology, University of Nebraska at Omaha, United States
Harvey Siy , College of Information Science and Technology, University of Nebraska at Omaha, United States
pp. 6-8

Data analysis anti-patterns in empirical software engineering (Abstract)

Sandro Morasca , Department of Theoretical and Applied Sciences, Università degli Studi dell'Insubria, Como, Italy
pp. 9-10

Effect size analysis (Abstract)

Emanuel Giger , Department of Informatics, University of Zurich, Switzerland
Harald C. Gall , Department of Informatics, University of Zurich, Switzerland
pp. 11-13

Exploring software engineering data with formal concept analysis (Abstract)

Xiaobing Sun , School of Information Engineering, Yangzhou University, China
Ying Chen , School of Information Engineering, Yangzhou University, China
Bin Li , School of Information Engineering, Yangzhou University, China
Bixin Li , School of Computer Science and Engineering, Southeast University, Nanjing, China
pp. 14-16

Extracting artifact lifecycle models from metadata history (Abstract)

Olga Baysal , David R. Cheriton School of Computer Science, University of Waterloo, Canada
Oleksii Kononenko , David R. Cheriton School of Computer Science, University of Waterloo, Canada
Reid Holmes , David R. Cheriton School of Computer Science, University of Waterloo, Canada
Michael W. Godfrey , David R. Cheriton School of Computer Science, University of Waterloo, Canada
pp. 17-19

Measure what counts: An evaluation pattern for software data analysis (Abstract)

Emmanuel Letier , Dept. of Computer Science, University College London, United Kingdom
Camilo Fitzgerald , Dept. of Computer Science, University College London, United Kingdom
pp. 20-22

Parametric classification over multiple samples (Abstract)

Barbara Russo , Faculty of Computer Science, Free University of Bozen-Bolzano, Italy
pp. 23-25

Patterns for cleaning up bug data (Abstract)

Rodrigo Souza , Dept. of Computer Science, Federal University of Bahia, Brazil
Christina Chavez , Dept. of Computer Science, Federal University of Bahia, Brazil
Roberto Bittencourt , Dept. of Computer Science, Federal University of Bahia, Brazil
pp. 26-28

Patterns for extracting high level information from bug reports (Abstract)

Rodrigo Souza , Dept. of Computer Science, Federal University of Bahia, Brazil
Christina Chavez , Dept. of Computer Science, Federal University of Bahia, Brazil
Roberto Bittencourt , Dept. of Computer Science, Federal University of Bahia, Brazil
pp. 29-31

Structural and temporal patterns-based features (Abstract)

Venkatesh-Prasad Ranganath , Microsoft Research, India
Jithin Thomas , Microsoft Research, India
pp. 32-34

The chunking pattern (Abstract)

David M. Weiss , Iowa State University, Ames, USA
Audris Mockus , Avaya Labs Research, Basking Ridge, NJ, USA
pp. 35-37
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