The Community for Technology Leaders
Design Automation Conference (2000)
Los Angeles, CA
June 5, 2000 to June 9, 2000
ISBN: 1-58113-1897-9
pp: 790-793
Sreejit Chakravarty , Intel Corporation, Santa Clara, CA
Carl D. Roth , Intel Corporation, Santa Clara, CA
Sujit T. Zachariah , Intel Corporation, Santa Clara, CA
Defect based testing is based on the premise that it is possible to extract high probability defects viz. bridges and opens using layout and defect data. We present a very efficient algorithm to extract two-node bridges from layout. Comparison results with a popular tool show that our algorithm is considerably faster and that it has higher capacity.
fault modeling, fault simulation, hard faults, test vector generation
Sreejit Chakravarty, Carl D. Roth, Sujit T. Zachariah, "A Novel Algorithm to Extract Two-Node Bridges", Design Automation Conference, vol. 00, no. , pp. 790-793, 2000, doi:10.1109/DAC.2000.855421
93 ms
(Ver 3.3 (11022016))