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Design Automation Conference (2000)
Los Angeles, CA
June 5, 2000 to June 9, 2000
ISBN: 1-58113-1897-9
pp: 631-636
Amir Attarha , The Univ. of Texas at Dallas
Carco Lucas , The Univ. of Tehran, Iran
Mehradad Nourani , The Univ. of Texas at Dallas
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the traditional zero-resistance model is not sufficient. Then, we present a resistive fault model for real defects and use fuzzy logic techniques for fault simulation and test pattern generation at the gate-level. Our method produces more realistic fault coverage compared to the conventional methods. The experimental results include the fault coverage and test pattern statistics for the ISCAS85 benchmarks.
MPEG-2, SIMD, automatic target recognition, dynamic configuration, reconfigurable processors, scheduling
Amir Attarha, Carco Lucas, Mehradad Nourani, "Modeling and Simulation of Real Defects using Fuzzy Logic", Design Automation Conference, vol. 00, no. , pp. 631-636, 2000, doi:10.1109/DAC.2000.855389
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