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Design Automation Conference (2000)
Los Angeles, CA
June 5, 2000 to June 9, 2000
ISBN: 1-58113-1897-9
pp: 162-167
Tim Edwards , Motorola Inc., Austin-TX
David Blaauw , Motorola Inc., Austin-TX
Rajat Chaudhry , Motorola Inc., Austin-TX
Rajendran Panda , Motorola Inc., Austin-TX
ABSTRACT
We present a novel approach to compress current signatures for IR-drop analysis of large power grids. Our approach divides the original current signature into error bounded compression sets. Each compression set has a representative timepoint. The compressed current signature consists of the representative timepoints. The compression technique exploits the pattern of change of individual currents, time locality and periodicity to achieve very high quality results. We provide error guarantees for the compression. Our results are superior in compression and accuracy in comparison to other compression methods such as the single cycle compression.
INDEX TERMS
fault modeling, fault simulation, hard faults, test vector generation
CITATION
Tim Edwards, David Blaauw, Rajat Chaudhry, Rajendran Panda, "Current Signature Compression for IR-Drop Analysis", Design Automation Conference, vol. 00, no. , pp. 162-167, 2000, doi:10.1109/DAC.2000.855296
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