Design Automation Conference (2000)
Los Angeles, CA
June 5, 2000 to June 9, 2000
M. Steyaert , Katholieke Universiteit Leuven, Belgium
C. De Ranter , Katholieke Universiteit Leuven, Belgium
G. Gielen , Katholieke Universiteit Leuven, Belgium
Peter Vancorenland , Katholieke Universiteit Leuven, Belgium
This paper presents an optimization algorithm that is able to significantly increase the speed of RF circuit optimizations. The algorithm consists of a series of consecutive evolutionary optimizations of the circuit itself and of a modeled version thereof. The speed increase arises from the difference in evaluation time between the real simulation and the fit evaluation. As circuit approximation, behavioral models are used instead of polynomial expressions, allowing to put some "design knowledge" into the optimization. gaRFeeld is a tool implementing this smart evolutionary algorithm for RF circuits. Finally some experiments performed with gaRFeeld are illustrated for the optimization of a Low Noise Amplifier.
fault modeling, fault simulation, hard faults, test vector generation
G. Gielen, C. De Ranter, M. Steyaert and P. Vancorenland, "Optimal RF Design using Smart Evolutionary Algorithms," Design Automation Conference(DAC), Los Angeles, CA, 2000, pp. 7-10.