The Community for Technology Leaders
Design Automation Conference (1988)
Anaheim, CA, USA
June 12, 1988 to June 15, 1988
ISBN: 0-8186-0864-1
pp: 605-608
Lin , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Ho , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
ABSTRACT
An algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weight-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.
INDEX TERMS
functional test, microprocessors, O-algorithm, automatic test program generation, user environment, weight-digraph model, signal flow
CITATION

Ho and Lin, "Automatic functional test program generation for microprocessors," Design Automation Conference(DAC), Anaheim, CA, USA, 1988, pp. 605-608.
doi:10.1109/DAC.1988.14825
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