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Design Automation Conference (1988)
Anaheim, CA, USA
June 12, 1988 to June 15, 1988
ISBN: 0-8186-0864-1
pp: 591-596
Mao , Dept. of Electr. Eng., Colarado Univ., Colorado Springs, CO, USA
Ciletti , Dept. of Electr. Eng., Colarado Univ., Colorado Springs, CO, USA
ABSTRACT
The authors present a self-learning algorithm using a dynamic testability measure to accelerate test generation. They introduce the concepts of full-logic-value label-backward implication, dependent backtrack, and K-limited backtracks. Results indicating a high fault coverage are presented for ten benchmark combinational circuits.
INDEX TERMS
test generation acceleration, DYTEST, self-learning algorithm, dynamic testability measures, full-logic-value label-backward implication, dependent backtrack, K-limited backtracks, high fault coverage, benchmark combinational circuits
CITATION

Mao and Ciletti, "DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation," Design Automation Conference(DAC), Anaheim, CA, USA, 1988, pp. 591-596.
doi:10.1109/DAC.1988.14822
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