Design Automation Conference (1988)
Anaheim, CA, USA
June 12, 1988 to June 15, 1988
Chao , Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Gray , Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
A determination is made of the best micro-operation perturbation for modeling faults at the chip level. The measure used is the gate level stuck-at-fault coverage achieved by the tests derived to cover the micro-operation perturbation faults. For small combination circuits, it is shown that perturbing the elements into the logic dual is a good choice. For large combinational circuits, it is shown that there is very little variation in the gate level coverage achieved by the various microoperation faults. In this case, if coverage is to be improved, the micro-operation perturbation method must be augmented by other techniques.
logic testing, chip level fault modeling, micro-operation perturbation, stuck-at-fault coverage, combination circuits, gate level coverage
Chao and Gray, "Micro-operation perturbations in chip level fault modeling," Design Automation Conference(DAC), Anaheim, CA, USA, 1988, pp. 579-582.