The Community for Technology Leaders
Design Automation Conference (1988)
Anaheim, CA, USA
June 12, 1988 to June 15, 1988
ISBN: 0-8186-0864-1
pp: 294-299
Burch , Texas Instrum Inc., Dallas, TX, USA
Najm , Texas Instrum Inc., Dallas, TX, USA
Yang , Texas Instrum Inc., Dallas, TX, USA
Hocevar , Texas Instrum Inc., Dallas, TX, USA
ABSTRACT
Accurate and efficient expected current is required in circuit designs to analyze electromigration failure rate, power consumption, voltage drop, etc. A pattern-independent simulation approach for estimating this expected current waveform drawn by CMOS circuitry has been developed. Four original concepts are presented which allow an efficient and accurate estimation of expected current waveforms. They are: probability waveforms, probability waveform propagation, probabilistic circuit models, and statistical timing analysis. This approach is considerably faster than traditional methods and yields comparable results.
INDEX TERMS
reliability analysis, CMOS circuits, electromigration failure rate, power consumption, voltage drop, pattern-independent simulation approach, current waveform, probability waveforms, probability waveform propagation, probabilistic circuit models, statistical timing analysis
CITATION

Hocevar, Burch, Najm and Yang, "Pattern-independent current estimation for reliability analysis of CMOS circuits," Design Automation Conference(DAC), Anaheim, CA, USA, 1988, pp. 294-299.
doi:10.1109/DAC.1988.14773
86 ms
(Ver 3.3 (11022016))