The Community for Technology Leaders
Design Automation Conference (1988)
Anaheim, CA, USA
June 12, 1988 to June 15, 1988
ISBN: 0-8186-0864-1
pp: 96-101
Cheng , AT&T Eng. Res. Center, Princeton, NJ, USA
ABSTRACT
A novel circuit model, SPLIT, is presented which is a modified 9-valued circuit model. SPLIT has the precision of the 9-valued model and the simplicity of the 5-valued model. So that its D-algorithm has better performance than that of the 5-valued or the 9-valued model.
INDEX TERMS
automatic test generation, SPLIT circuit model, test generation, modified 9-valued circuit model, precision, simplicity, D-algorithm
CITATION

Cheng, "SPLIT circuit model for test generation," Design Automation Conference(DAC), Anaheim, CA, USA, 1988, pp. 96-101.
doi:10.1109/DAC.1988.14741
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