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Design Automation Conference (1988)
Anaheim, CA, USA
June 12, 1988 to June 15, 1988
ISBN: 0-8186-0864-1
pp: 90-95
Glover , Dept. of Electr. & Comput. Eng., Austin Univ., TX, USA
Mercer , Dept. of Electr. & Comput. Eng., Austin Univ., TX, USA
ABSTRACT
The authors propose an efficient deterministic method of delay fault test generation. For most common circuits, the proposed technique has a time complexity which is polynomial in the size of the circuit, as opposed to existing deterministic methods which, for nearly all circuits, are exponential. They define a type of transition path, the fully transitional path (FTP), and demonstrate that it has several useful properties. An FTP can be created by applying a vector pair derived from a stuck-at test for a primary input. The authors extend this method by using an alternate representation for switching functions, the binary decision diagram, to generate graphs representing stuck-at-tests. The concept of free variables is defined as a tool for deriving several FTPs from one stuck-at test. Preliminary results are presented which indicate that the method provides a higher robust delay fault coverage than pseudorandom patterns at less than one-fifth the cost.
INDEX TERMS
automatic test generation, delay fault test generation, fully transitional path, binary decision diagram, graphs representing stuck-at-tests, robust delay fault coverage
CITATION

Glover and Mercer, "A method of delay fault test generation," Design Automation Conference(DAC), Anaheim, CA, USA, 1988, pp. 90-95.
doi:10.1109/DAC.1988.14740
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