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2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) (2017)
Honolulu, Hawaii, USA
July 21, 2017 to July 26, 2017
ISSN: 2160-7516
ISBN: 978-1-5386-0733-6
pp: 1132-1140
ABSTRACT
Recent research on super-resolution has progressed with the development of deep convolutional neural networks (DCNN). In particular, residual learning techniques exhibit improved performance. In this paper, we develop an enhanced deep super-resolution network (EDSR) with performance exceeding those of current state-of-the-art SR methods. The significant performance improvement of our model is due to optimization by removing unnecessary modules in conventional residual networks. The performance is further improved by expanding the model size while we stabilize the training procedure. We also propose a new multi-scale deep super-resolution system (MDSR) and training method, which can reconstruct high-resolution images of different upscaling factors in a single model. The proposed methods show superior performance over the state-of-the-art methods on benchmark datasets and prove its excellence by winning the NTIRE2017 Super-Resolution Challenge[26].
INDEX TERMS
Training, Image resolution, Computer architecture, Computational modeling, Signal resolution, Image reconstruction, Convolution
CITATION

B. Lim, S. Son, H. Kim, S. Nah and K. M. Lee, "Enhanced Deep Residual Networks for Single Image Super-Resolution," 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Honolulu, Hawaii, USA, 2017, pp. 1132-1140.
doi:10.1109/CVPRW.2017.151
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