The Community for Technology Leaders
2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2003. Proceedings. (2003)
Madison, Wisconsin
June 18, 2003 to June 20, 2003
ISSN: 1063-6919
ISBN: 0-7695-1900-8
pp: 177
Hossein Ragheb , University of York
Edwin R. Hancock , University of York
ABSTRACT
In this paper, we make use of the Beckmann-Kirchhoff and Davies scattering models to estimate surface properties for both dielectric and metallic surfaces based on reflectance measurements. In the case of metallic surfaces, we consider two refinements of the Davies theory which apply under different restrictions concerning the reflectance geometry. The first of these is due to Bennett and Porteus and applies for normal incidence and reflectance. The second is due to Torrance and applies when the incidence radiation is off normal. We then suggest three classes of materials for which the appropriate approximations may be used to estimate the surface roughness, the correlation length and the surface slope. Finally, we use the surface slope estimates to fit the Beckmann-Kirchhoff model to reflectance data. In contrast to previous methods which work at long wavelengths and use special purpose instrumentation, our methods can be performed using visible light and a digital camera.
INDEX TERMS
null
CITATION

H. Ragheb and E. R. Hancock, "Estimating Surface Characteristics using Physical Reflectance Models," 2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2003. Proceedings.(CVPR), Madison, Wisconsin, 2003, pp. 177.
doi:10.1109/CVPR.2003.1211468
93 ms
(Ver 3.3 (11022016))