The Community for Technology Leaders
2012 IEEE 21st Asian Test Symposium (2012)
Niigata, Japan Japan
Nov. 19, 2012 to Nov. 22, 2012
ISSN: 1081-7735
ISBN: 978-1-4673-4555-2
TABLE OF CONTENTS
Papers

[Cover art] (PDF)

pp. C4

[Title page iii] (PDF)

pp. iii

Table of contents (PDF)

pp. v-xii

Foreword (PDF)

pp. xii

Program Committee (PDF)

pp. xiv-xv

Reviewers (PDF)

pp. xvi

Tutorials (PDF)

pp. xviii-xix

Author index (PDF)

pp. 362-364
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