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2012 IEEE 21st Asian Test Symposium (2012)
Niigata, Japan Japan
Nov. 19, 2012 to Nov. 22, 2012
ISSN: 1081-7735
ISBN: 978-1-4673-4555-2
pp: 220
Summary form only given, as follows. Power-aware testing is facing more and more challenges in terms of test power analysis as well as test power management due to the ever-growing gap between functional power and test power for low-power LSI circuits. This special session, presented by top experts from both academia and industry, will provide firsthand information on state-of-the-art solutions as well as insightful perspectives on future R&D directions about power-aware testing. It will help researchers and practitioners alike in advancing poweraware test technologies for low-power LSI circuits, the enabler of all energy-smart electronic devices that are now indispensable in our everyday life.

S. M. Reddy and X. Wen, "Session Summary III: Power-Aware Testing: Present and Future," 2012 IEEE 21st Asian Test Symposium(ATS), Niigata, Japan Japan, 2012, pp. 220.
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