2012 IEEE 21st Asian Test Symposium (2012)
Niigata, Japan Japan
Nov. 19, 2012 to Nov. 22, 2012
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2012.32
The automotive industry has to deal with an increasing amount of electronics in today's vehicles. This paper describes the advantages of structural tests during in-field system test, reusing existing test data and on-chip structures. Demonstration is the embedded test of an ASIC within an automotive control unit, utilizing manufacturing scan-tests.
Automotive engineering, Manufacturing, Clocks, Failure analysis, System-on-a-chip, Built-in self-test, electronic control unit, system test, scan-test, in-field, automotive
A. Cook, D. Ull, M. Elm, H. Wunderlich, H. Randoll and S. Dohren, "Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs," 2012 IEEE 21st Asian Test Symposium(ATS), Niigata, Japan Japan, 2012, pp. 214-219.