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2012 IEEE 21st Asian Test Symposium (2012)
Niigata, Japan Japan
Nov. 19, 2012 to Nov. 22, 2012
ISSN: 1081-7735
ISBN: 978-1-4673-4555-2
pp: 179-184
ABSTRACT
This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sine waves, for communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit °¢ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.
INDEX TERMS
Distortion Shaping, ADC Testing, Two-Tone Signal, Intermodulation Distortion, Arbitrary Waveform Generator S?DAC, Digital Pre-Distortion
CITATION

K. Kato et al., "Two-Tone Signal Generation for Communication Application ADC Testing," 2012 IEEE 21st Asian Test Symposium(ATS), Niigata, Japan Japan, 2012, pp. 179-184.
doi:10.1109/ATS.2012.12
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