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2012 IEEE 21st Asian Test Symposium (2012)
Niigata, Japan Japan
Nov. 19, 2012 to Nov. 22, 2012
ISSN: 1081-7735
ISBN: 978-1-4673-4555-2
pp: 71-76
While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non-intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.
Instruments, Vectors, Schedules, Hip, Clocks, Logic gates, Registers, embedded instruments, IEEE P1687 IJTAG, IEEE 1149.1

E. Larsson and F. G. Zadegan, "Accessing Embedded DfT Instruments with IEEE P1687," 2012 IEEE 21st Asian Test Symposium(ATS), Niigata, Japan Japan, 2012, pp. 71-76.
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