2012 IEEE 21st Asian Test Symposium (2012)
Niigata, Japan Japan
Nov. 19, 2012 to Nov. 22, 2012
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2012.85
Xinli Gu , Huawei Technologies, USA
Summary form only given, as follows. This session presents the importance of product quality and reliability from both a customer perspective and VLSI component perspective. DFT technologies ranging from VLSI component design, manufacturing, test to diagnosis and even to product customer site (in-field) test are discussed to help product reliability. Four presentations in this session will cover quality memory test, flash storage in-field test, special ASIC DFT feature design and board/system usage of component level DFT features.
X. Gu, "Session Summary II: Dependable VLSI for Product Reliability," 2012 IEEE 21st Asian Test Symposium(ATS), Niigata, Japan Japan, 2012, pp. 67.