The Community for Technology Leaders
2012 IEEE 21st Asian Test Symposium (2012)
Niigata
Nov. 19, 2012 to Nov. 22, 2012
ISSN: 1081-7735
ISBN: 978-1-4673-4555-2
TABLE OF CONTENTS

[Cover art] (PDF)

pp. C4

Programmable Leakage Test and Binning for TSVs (Abstract)

Yu-Hsiang Lin , Electr. Eng. Dept., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Shi-Yu Huang , Electr. Eng. Dept., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 43-48
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