The Community for Technology Leaders
2012 IEEE 21st Asian Test Symposium (2010)
Shanghai, Shanghai China
Dec. 1, 2010 to Dec. 4, 2010
ISSN: 1081-7735
ISBN: 978-0-7695-4248-5
TABLE OF CONTENTS
Papers

[Front cover] (PDF)

pp. C1

Title Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Table of contents (PDF)

pp. v-xi

Organizing Committee (PDF)

pp. xiv-xvi

list-reviewer (PDF)

pp. xvii

Author Index (PDF)

pp. 461-463
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