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2008 17th Asian Test Symposium (2008)
Nov. 24, 2008 to Nov. 27, 2008
ISSN: 1081-7735
ISBN: 978-0-7695-3396-4
pp: 321-326
ABSTRACT
Biased random test generation is one of the most important methods for the verification of modern complex processors. As the complexity of processors grows, the bottleneck remains in generating suitable test programs that meet coverage metrics automatically. Many technologies have been proposed to implement the automatic feedback loop. In this paper, we introduce our coverage directed test generation scheme which combines traditional biased random test generation and genetic algorithms to feed back process. It is the first time we use our scheme in our real industrial processor verification independently and successfully without human intervention. The efficiency of our approach has been demonstrated by the practical results.
INDEX TERMS
Microprocessor, Verification, Coverage directed test generation
CITATION

B. Chen, H. Shen, Q. Guo, Y. Chen and W. Wei, "Coverage Directed Test Generation: Godson Experience," 2008 17th Asian Test Symposium(ATS), vol. 00, no. , pp. 321-326, 2008.
doi:10.1109/ATS.2008.42
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