2012 IEEE 21st Asian Test Symposium (2008)
Nov. 24, 2008 to Nov. 27, 2008
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2008.68
This paper presents a low-cost wafer-level test methodology for the source driver ICs of liquid crystal displays; the idea is to realize the test circuitry on the wafer scribe line. The proposed technique not only substantially reduces the required ATE I/O channels but also eliminates the need of high-speed digitization units on the ATE. Furthermore, because the test circuitry is realized on the scribe line, no modification is made to the circuit under test, i.e., the proposed methodology does not incur any area or performance overhead.
BIST, TFT-LCD, source driver
Jiun-Lang Huang, Jui-Jer Huang, Chiuan-Che Li, "Testing LCD Source Driver IC with Built-on-Scribe-Line Test Circuitry", 2012 IEEE 21st Asian Test Symposium, vol. 00, no. , pp. 117-122, 2008, doi:10.1109/ATS.2008.68