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14th Asian Test Symposium (ATS'05) (2005)
Calcutta, India
Dec. 18, 2005 to Dec. 21, 2005
ISSN: 1081-7735
ISBN: 0-7695-2481-8
pp: 450
Tom Waayers , Philips Research Laboratories, The Netherlands
Erik Jan Marinissen , Philips Research Laboratories, The Netherlands
Maurice Lousberg , Philips Research Laboratories, The Netherlands
ABSTRACT
Modern semiconductor process technologies enable the manufacturing of a complete system on one single die, the so-called system-on-chip or SOC. Building those chips in a timely and cost-effective manner is amongst others realized by embedding third-party IP cores. Due to imperfections in silicon manufacturing, an SOC including all its embedded modules needs to be tested for manufacturing defects.
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CITATION

M. Lousberg, E. J. Marinissen and T. Waayers, "IEEE Std 1500 Compliant Infrastructure forModular SOC Testing," 14th Asian Test Symposium (ATS'05)(ATS), Calcutta, India, 2005, pp. 450.
doi:10.1109/ATS.2005.67
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