14th Asian Test Symposium (ATS'05) (2005)
Dec. 18, 2005 to Dec. 21, 2005
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2005.67
Tom Waayers , Philips Research Laboratories, The Netherlands
Erik Jan Marinissen , Philips Research Laboratories, The Netherlands
Maurice Lousberg , Philips Research Laboratories, The Netherlands
Modern semiconductor process technologies enable the manufacturing of a complete system on one single die, the so-called system-on-chip or SOC. Building those chips in a timely and cost-effective manner is amongst others realized by embedding third-party IP cores. Due to imperfections in silicon manufacturing, an SOC including all its embedded modules needs to be tested for manufacturing defects.
M. Lousberg, E. J. Marinissen and T. Waayers, "IEEE Std 1500 Compliant Infrastructure forModular SOC Testing," 14th Asian Test Symposium (ATS'05)(ATS), Calcutta, India, 2005, pp. 450.