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2003 Test Symposium (2003)
Xi?an, China
Nov. 16, 2003 to Nov. 19, 2003
ISSN: 1081-7735
ISBN: 0-7695-1951-2
pp: 458
Ling Liu , Peking University
Wennan Feng , Peking University
Song Jia , Peking University
Anping Jiang , Peking University
Lijiu Ji , Peking University
ABSTRACT
Microprocessors are extremely versatile and complexity that present significantly test challenges. This paper describes a retargetable functional test platform system design for various microprocessors. Characterized by configurable test environment generator, retargetable assembler and strong ATPG, the platform system could automatically produce different test environment and assemble out relative test codes to adapt to the microprocessor under test. Experiments show that the platform system works correctly, flexibly and efficiently.
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CITATION

W. Feng, L. Ji, A. Jiang, S. Jia and L. Liu, "Design Retargetable Platform System for Microprocessor Functional Test," 2003 Test Symposium(ATS), Xi?an, China, 2003, pp. 458.
doi:10.1109/ATS.2003.1250856
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