The Community for Technology Leaders
2003 Test Symposium (2003)
Xi?an, China
Nov. 16, 2003 to Nov. 19, 2003
ISSN: 1081-7735
ISBN: 0-7695-1951-2
pp: 32
F. Bertuccelli , Aurelia Microelettronica S.p.A
F. Bigongiari , Aurelia Microelettronica S.p.A
A. S. Brogna , Universit? di Pisa
G. Di Natale , Politecnico di Torino
P. Prinetto , Politecnico di Torino
R. Saletti , Universit? di Pisa
ABSTRACT
<p>This paper presents a customizable injection fault system and performance evaluations of dependable memory collars designed by GRAAL tool. The novelty consists in a large number of tests and architecture comparisons which can demonstrate the efficiency and validity of GRAAL and how it helps the designer to experiment the architecture sensitivity and evaluate changes in performances when a particular dependable memory collar is chosen or bypassed.</p> <p>Moreover, a complete test set-up and real case study where the memory interacts in a complex system is described. The system collects information to measure the effects of fault detection and fault tolerance. The hardware is assembled in a configurable test board with a FPGA where are one of several memory wrapper which GRAAL generates and a serial link to receive and send data from an acquisition system. Two commercial Personal Computers interact thought the boards and collect data from the experiment.</p>
INDEX TERMS
null
CITATION

F. Bertuccelli, G. Di Natale, F. Bigongiari, R. Saletti, P. Prinetto and A. S. Brogna, "Exhaustive Test of Several Dependable Memory Architectures Designed by GRAAL Tool," 2003 Test Symposium(ATS), Xi?an, China, 2003, pp. 32.
doi:10.1109/ATS.2003.1250779
94 ms
(Ver 3.3 (11022016))