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Proceedings 10th Asian Test Symposium (2001)
Kyoto, Japan
Nov. 19, 2001 to Nov. 21, 2001
ISBN: 0-7695-1378-6
pp: 157
Alfredo Benso , Politecnico di Torino
Stefano Di Carlo , Politecnico di Torino
Giorgio Di Natale , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
ABSTRACT
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set of memory faults in very low computation time. Moreover, we propose a new complete taxonomy for memory read faults, a class of faults never carefully addressed in the past.
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CITATION

P. Prinetto, G. Di Natale, A. Benso and S. Di Carlo, "Memory Read Faults: Taxonomy and Automatic Test Generation," Proceedings 10th Asian Test Symposium(ATS), vol. 00, no. , pp. 157, 2001.
doi:10.1109/ATS.2001.990275
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