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2012 IEEE 21st Asian Test Symposium (2000)
Taipei, Taiwan
Dec. 4, 2000 to Dec. 6, 2000
ISSN: 1081-7735
ISBN: 0-7695-0887-1
pp: 151
J. Dworak , Comput. Eng. Group, Texas A&M Univ., College Station, TX, USA
M.R. Mercer , Comput. Eng. Group, Texas A&M Univ., College Station, TX, USA
B. Cobb , Comput. Eng. Group, Texas A&M Univ., College Station, TX, USA
T.-C. Wang , Comput. Eng. Group, Texas A&M Univ., College Station, TX, USA
L.-C. Wang , Comput. Eng. Group, Texas A&M Univ., College Station, TX, USA
M.R. Grimaila , Comput. Eng. Group, Texas A&M Univ., College Station, TX, USA
ABSTRACT
Uses data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect bridging surrogates. We show that the coefficient of correlation between these tests approaches zero as the stuck-at fault coverage approaches 100%. An enhanced version of the MPG-D model, which is based upon the number of detections of each site in a logic circuit, is shown to be superior to stuck-at fault coverage-based defective part level prediction. We then compare the accuracy of both predictors for an industrial circuit tested using two different test pattern sequences.
INDEX TERMS
circuit simulation; integrated logic circuits; integrated circuit testing; automatic test pattern generation; fault simulation; DO-RE-ME technique; MPG-D model; ATPG; defective part level prediction; benchmark circuit simulations; stuck-at fault detection tests; bridging surrogate detection; correlation coefficient; stuck-at fault coverage; logic circuit; predictor accuracy; industrial circuit; test pattern sequences
CITATION
J. Dworak, M.R. Mercer, B. Cobb, T.-C. Wang, L.-C. Wang, M.R. Grimaila, "On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction", 2012 IEEE 21st Asian Test Symposium, vol. 00, no. , pp. 151, 2000, doi:10.1109/ATS.2000.893618
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