Proceedings of the Fourth Asian Test Symposium (1995)
Nov. 23, 1995 to Nov. 24, 1995
A.K.B. A'ain , Microelectron. Res. Group, Lancaster Univ., UK
A.H. Bratt , Microelectron. Res. Group, Lancaster Univ., UK
A.P. Dorey , Microelectron. Res. Group, Lancaster Univ., UK
This paper discusses a novel testing technique for analogue circuits. The theory behind its success in exposing defects normally unexposed by other testing techniques is presented. This is supported by simulation results and real IC tests. Due to its modest requirement to perform the test, this testing scheme is more attractive and beneficial. Methods of data analysis are also proposed to expose hard and soft defects. The advantages of the proposed testing scheme are fast to implement, uses simple test vector and does not require additional test circuitry on-chip.
fault diagnosis; power supply circuits; voltage control; integrated circuit testing; analogue integrated circuits; circuit analysis computing; data analysis; operational amplifiers; power supply voltage control testing; analogue circuits; operational amplifier; simulation; IC tests; data analysis; hard defects; soft defects
A. Bratt, A. A'ain and A. Dorey, "On the development of power supply voltage control testing technique for analogue circuits," Proceedings of the Fourth Asian Test Symposium(ATS), Bangalore, India, 1995, pp. 133.