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London, England
May 30, 1995 to May 31, 1995
ISBN: 0-8186-7098-3
pp: 63
R. van de Wiel , Dept. of Math. & Comput. Sci., Eindhoven Univ. of Technol., Netherlands
ABSTRACT
The present a method for evaluating production fault tests for asynchronous circuits. A novel fault model is defined, based on a high-level circuit description, allowing the evaluation of production tests on the design level. This evaluation method is used in the test generation for an asynchronous 22 k transistor DCC error corrector IC, resulting in a fault coverage of 99.8%.
INDEX TERMS
asynchronous circuits; logic testing; VLSI; error detection codes; asynchronous circuits; high-level test evaluation; production fault tests; fault model; high-level circuit description; asynchronous 22 k transistor DCC error corrector IC
CITATION
R. van de Wiel, "High-level test evaluation of asynchronous circuits", ASYNC, 1995, 2012 IEEE 18th International Symposium on Asynchronous Circuits and Systems, 2012 IEEE 18th International Symposium on Asynchronous Circuits and Systems 1995, pp. 63, doi:10.1109/WCADM.1995.514643
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