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Automation of Software Test, Second International Workshop on (2009)
Vancouver, BC Canada
May 18, 2009 to May 19, 2009
ISBN: 978-1-4244-3711-5
pp: 44-52
Alberto Avritzer , Siemens Corporate Research, 755 College Road East, Princeton, NJ 08540, USA
Elaine J. Weyuker , AT&T Labs - Research, 180 Park Avenue, Florham Park, NJ 07932, USA
ABSTRACT
We present a new approach for the automated generation of test cases to be used for demonstrating the reliability of large industrial mission-critical systems. In this paper we extend earlier work by adding failure tracking and transient Markov chain analysis. Results from the transient Markov chain analysis are used to estimate the software reliability at a given system execution time.
INDEX TERMS
automatic test pattern generation, failure analysis, industries, Markov processes, reliability
CITATION

A. Avritzer and E. J. Weyuker, "The automated generation of test cases using an extended domain based reliability model," 2009 ICSE Workshop on Automation of Software Test (AST 2009)(AST), Vancouver, BC, 2009, pp. 44-52.
doi:10.1109/IWAST.2009.5069040
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