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2017 32nd IEEE/ACM International Conference on Automated Software Engineering (ASE) (2017)
Urbana, IL, USA
Oct. 30, 2017 to Nov. 3, 2017
ISBN: 978-1-5386-3976-4
pp: 353-364
Soomin Kim , KAIST, Republic of Korea
Markus Faerevaag , KAIST, Republic of Korea
Minkyu Jung , KAIST, Republic of Korea
Seungll Jung , KAIST, Republic of Korea
DongYeop Oh , KAIST, Republic of Korea
JongHyup Lee , Gachon University, Republic of Korea
Sang Kil Cha , KAIST, Republic of Korea
ABSTRACT
Binary lifting, which is to translate a binary executable to a high-level intermediate representation, is a primary step in binary analysis. Despite its importance, there are only few existing approaches to testing the correctness of binary lifters. Furthermore, the existing approaches suffer from low test coverage, because they largely depend on random test case generation. In this paper, we present the design and implementation of the first systematic approach to testing binary lifters. We have evaluated the proposed system on 3 state-of-the-art binary lifters, and found 24 previously unknown semantic bugs. Our result demonstrates that writing a precise binary lifter is extremely difficult even for those heavily tested projects.
INDEX TERMS
Semantics, Computer bugs, Binary codes, Testing, Tools, Software, C++ languages
CITATION

S. Kim et al., "Testing intermediate representations for binary analysis," 2017 32nd IEEE/ACM International Conference on Automated Software Engineering (ASE), Urbana, IL, USA, 2017, pp. 353-364.
doi:10.1109/ASE.2017.8115648
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