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2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011) (2004)
Linz, Austria
Sept. 20, 2004 to Sept. 24, 2004
ISSN: 1068-3062
ISBN: 0-7695-2131-2
pp: 274-277
Liu Chang , Beijing University of Aeronautics and Astronautics, Beijing, China
Jin Mao-zhong , Beijing University of Aeronautics and Astronautics, Beijing, China
Jia Xiao-xia , Beijing University of Aeronautics and Astronautics, Beijing, China
Yang Hai-yan , Beijing University of Aeronautics and Astronautics, Beijing, China
Wu Ji , Beijing University of Aeronautics and Astronautics, Beijing, China
Liu Chao , Beijing University of Aeronautics and Astronautics, Beijing, China
ABSTRACT
We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.
INDEX TERMS
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CITATION
Liu Chang, Jin Mao-zhong, Jia Xiao-xia, Yang Hai-yan, Wu Ji, Liu Chao, "A Statistical Model to Locate Faults at Input Level", 2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011), vol. 00, no. , pp. 274-277, 2004, doi:10.1109/ASE.2004.10008
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