Asia-Pacific Conference on Quality Software (2000)

Hong Kong, China

Oct. 30, 2000 to Oct. 31, 2000

ISBN: 0-7695-0825-1

pp: 149

T.H. Tse , University of Hong Kong

T.Y. Chen , Swinburne University of Technology

X. Feng , University of Hong Kong

ABSTRACT

Most research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper, we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary “++” or “--”, then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessary.

INDEX TERMS

Arithmetic expressions, completeness of test cases, mutation operators, mutation testing, software testing

CITATION

T.H. Tse,
T.Y. Chen,
X. Feng,
"On the Completeness of Test Cases for Atomic Arithmetic Expressions",

*Asia-Pacific Conference on Quality Software*, vol. 00, no. , pp. 149, 2000, doi:10.1109/APAQ.2000.883788