The Community for Technology Leaders
Asia-Pacific Conference on Quality Software (2000)
Hong Kong, China
Oct. 30, 2000 to Oct. 31, 2000
ISBN: 0-7695-0825-1
pp: 149
T.H. Tse , University of Hong Kong
T.Y. Chen , Swinburne University of Technology
X. Feng , University of Hong Kong
ABSTRACT
Most research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper, we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary “++” or “--”, then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessary.
INDEX TERMS
Arithmetic expressions, completeness of test cases, mutation operators, mutation testing, software testing
CITATION
T.H. Tse, T.Y. Chen, X. Feng, "On the Completeness of Test Cases for Atomic Arithmetic Expressions", Asia-Pacific Conference on Quality Software, vol. 00, no. , pp. 149, 2000, doi:10.1109/APAQ.2000.883788
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